STACLEAN CONDUCTIVE WAFER SPACER
PRODUCT SPECIFICATION
Our conductive wafer spacer has been developed to provide cleanroom with a paper that will reduce the risk of contamination and increase product yield. It is impregnated and coated with a special polymer formulation that inhibits particulate generation and chemical extractable.
Available is size(Diameter) of 4″,5″,6″8″ & 12″.
Specification:
Test Article | Unit | Test result |
Paper weight | g/m² | 71.7 |
Thickness | Mm/100 | 9.4 |
Bulk density | g/cm³ | 0.763 |
Burst density | kg/cm² | 304 |
Tensil Strength (MD) | kg | 5.47 |
Tensil strength (CD) | kg | 3.92 |
Tearing Strength (MD) | mN | 765 |
Tearing Strength (CD) | mN | 746 |
Folding Strength (MD) | log | More than 3.48 |
Folding Strength (CD) | log | More than 3.48 |
Surface Strength (F) | A | 16 |
Surface Strength (W) | A | 16 |
Smoothness | Second | 36 |
Smoothness | Second | 32 |
Permeability | Second | 42 |
Size Fastness | Second | 19 |
Opacity | % | 82.8 |
Ash Contents | % | 0.20 |
Softness (MD) | mg | 140 |
Softness(CD) | mg | 77 |
Surface PH |
Condition: 23°C RH50%
Dust Generation Degree | ||
<Over 0.1 µ m> | ||
Rubbing |
PC/CF |
170 |
Crumpling | 730 | |
Tearing/Rubbing | 868 | |
<Over 0.3 µ m> | ||
Rubbing |
PC/CF |
146 |
Crumpling | 335 | |
Tearing/Rubbing | 453 |
*1
Dissolution | ||
Time | min | 10 |
*2
*1 Test Method: SEMI 67-0996
- Crumpling: Test-piece of size A5 is manually rubbed once every 15 second for 200 seconds.
- Rubbing : Two test-piece of size A5 are prepared and put together, front and back, and manually rubbed three times every 10 seconds for 200 seconds.
- Tearing/Crumpling: Test-piece of size A5 is torn at four places (4cm interval) once every five seconds and then crumpled for 180 seconds in the same was as for the rubbing test.
*2 Test Method: TAPPI (Technology of US Pulp & Paper industry)
Paper 40g cut into about 2cm square is put in water of 2 liters at ordinary temperature and time to complete dissolving is measured using TAPPI standard pulp.
*Figures shown at the above are not guaranteed values but measured values.